Sökning: "Aberration-corrected TEM"

Hittade 3 avhandlingar innehållade orden Aberration-corrected TEM.

1. 1. Transmission Electron Microscopy of 2D Materials : Structure and Surface Properties

   Författare :Linda Karlsson; Per Persson; Javier Bareno; Linköpings universitet; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Transmission Electron Microscopy; Two-dimensional materials; Graphene; MXene; Ti3C2Tx; Low-voltage TEM; Aberration-corrected TEM; monchromated TEM; Scanning transmission electron microscopy; Electron energy loss spectroscopy;

   Sammanfattning : During recent years, new types of materials have been discovered with unique properties. One family of such materials are two-dimensional materials, which include graphene and MXene. These materials are stronger, more flexible, and have higher conductivity than other materials. As such they are highly interesting for new applications, e. LÄS MER

3. 2. Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers

   Författare :Amie Fallqvist; Per Persson; Lars Hultman; Linköpings universitet; []
   Nyckelord :;

   Sammanfattning : Two multilayer thin films have been studied: TiN/SiNx and ZrN/SiNx. A double-corrected transmission electron microscope (TEM) was utilized for imaging and spectroscopy. Imaging was carried out in scanning mode (STEM) for all samples. LÄS MER

4. 3. Transmission Electron Microscopy of Nanowires: Influence of Doping and Etching on Polytypism in InP

   Författare :Martin Ek; Centrum för analys och syntes; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

   Sammanfattning : Semiconductor nanowires have many properties which makes them interesting for future electronic devices. The fact that they have very small diameters allow them to combine different III-V materials into heterostructures, and makes it possible to grow them on Si substrates which are the basis of nearly all current semiconductor technology. LÄS MER