Sökning: "Halldor Olafsson"
Hittade 2 avhandlingar innehållade orden Halldor Olafsson.
1. Detection and removal of traps at the SiO2/SiC interface
Sammanfattning : The interface between silicon dioxide (SiO2) and silicon carbide (SiC) is at the heart of the SiC metal-oxide-semiconductor field-effect (MOSFET) transistor. The technology to produce a high quality SiO2/SiC interface does not exist today, hampering further development of the SiC MOSFET. LÄS MER
2. Shallow traps at the SiO₂/SiC interface
Sammanfattning : .... LÄS MER
Resultatsidor:
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