Sökning: "partial defect"
Visar resultat 11 - 15 av 48 avhandlingar innehållade orden partial defect.
11. Deep Levels in Electron-Irradiated and As-Grown SiC Power Device Material
Sammanfattning : Silicon Carbide (SiC) has several favorable physical properties for the fabrication of highpower, high-temperature and high-frequency devices. Devices in SiC can operate at high temperatures due to the wide band gap and the high thermal stability of the material. LÄS MER
12. Characterization of Process-related Defects in Silicon Carbide by Electron Microscopy
Sammanfattning : Silicon carbide (SiC) is a semiconducting material, which provides advantages compared to other available semiconducting materials. Attractive properties of SiC are the wide bandgap (2.2-3.3 eV), high electric breakdown field (3x106 Vcm-1), high thermal conductivity (5 Wcm-1 K-1) and the chemical stabi!ity. LÄS MER
13. Bound excitons in silicon carbide
Sammanfattning : The investigation of silicon carbide (SiC) is strongly motivated by the potential of this material for various demanding electronic applications. The main virtue of SiC is its toughness compared to other more common semiconductors. LÄS MER
14. Arc Evaporated Titanium Carbonitride Coatings
Sammanfattning : TiCxN1-x thin films is an important group of coatings for enhancing wear-resistance of, e.g., tools for metal cutting. The influence of microstructure, composition, and residual stress state, on the mechanical properties of such films, have been investigated. LÄS MER
15. Growth and Structural Characterization of SiC Crystals
Sammanfattning : Silicon carbide (SiC) is a promising semiconductor material for a variety of new device applications. These include high-power devices, high-voltage switching applications, hightemperature electronics, and high-power microwave applications. Due to its superior material properties SiC provides many advantages over Si. LÄS MER