Hittade 2 avhandlingar som matchar ovanstående sökkriterier.
1. Towards atomically resolved magnetic measurements in the transmission electron microscope : A study of structure and magnetic moments in thin films
Sammanfattning : The magnetic properties of thin metallic films are significantly different from the bulk properties due to the presence of interfaces. The properties shown by such thin films are influenced by the atomic level structure of the films and the interfaces. LÄS MER
2. Transmission Electron Microscopy for Characterization of Structures, Interfaces and Magnetic Moments in Magnetic Thin Films and Multilayers
Sammanfattning : Structural characterization is essential for the understanding of the magnetic properties of thin films and multilayers. In this thesis, both crystalline and amorphous thin films and multilayers were analyzed utilizing transmission electron microscopy (TEM). LÄS MER