Sökning: "Teknisk fysik med inriktning mot materialanalys"

Hittade 2 avhandlingar innehållade orden Teknisk fysik med inriktning mot materialanalys.

  1. 1. Towards atomically resolved magnetic measurements in the transmission electron microscope : A study of structure and magnetic moments in thin films

    Författare :Hasan Ali; Klaus Leifer; Peter Van Aken; Uppsala universitet; []
    Nyckelord :ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; NATURAL SCIENCES; NATURVETENSKAP; NATURVETENSKAP; NATURAL SCIENCES; Transmission electron microscope; thin films; magnetic moments; electron energy loss spectroscopy; simultaneous acquisition; electron magnetic circular dichroism; Teknisk fysik med inriktning mot materialanalys; Engineering Science with specialization in Materials Analysis;

    Sammanfattning : The magnetic properties of thin metallic films are significantly different from the bulk properties due to the presence of interfaces. The properties shown by such thin films are influenced by the atomic level structure of the films and the interfaces. LÄS MER

  2. 2. Building Systems for Electronic Probing of Single Low Dimensional Nano-objects : Application to Molecular Electronics and Defect Induced Graphene

    Författare :Syed Hassan Mujtaba Jafri; Klaus Leifer; Aidan Quinn; Uppsala universitet; []
    Nyckelord :ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; Graphene; defect induced graphene; molecular electronics; nanoelectrodes; nanoparticles; conductivity; junction; nanomaterial; focused ion beam; surface functionalization; electrical characterization; Teknisk fysik med inriktning mot materialanalys; Engineering Science with specialization in Materials Analysis;

    Sammanfattning : Nano-objects have unique properties due to their sizes, shapes and structure. When electronic properties of such nano-objects are used to build devices, the control of interfaces at atomic level is required. LÄS MER