Sökning: "atom probe field ion microscopy"
Visar resultat 1 - 5 av 20 avhandlingar innehållade orden atom probe field ion microscopy.
1. Atom-probe microanalysis of cermets
Sammanfattning : .... LÄS MER
2. Atom-Probe Field-Ion Microscopy of Electronic Materials
Sammanfattning : This thesis presents work in which atom-probe field-ion microscopy (APFIM) has been applied to two types of electronic materials. In the case of metal/GaAs contacts, the purpose was to characterise the microstructure of the contact interface, particularly the chemical composition variation across the interface. LÄS MER
3. Atom Probe Field Ion Microscopy of Surface Zones, Coatings and Interfaces
Sammanfattning : This thesis is focused on developingmethods for high resolution microanalysis of coatings on a substrate, andsurface zones of a bulk sample using atom probe field ion microscopy,APFIM. The APFIM technique is described and some examples of its applications to semiconductors,cemented carbides and intermetallic compounds are given. LÄS MER
4. Atom-probe microanalysis of the AuGe/GaAs interface
Sammanfattning : .... LÄS MER
5. Precipitation Reactions at High Temperatures in 9-12% Chromium Steels
Sammanfattning : This thesis reports on quantitative investigations of microstructural changes, mainly precipitation reactions, occurring during heat treatment, ageing and creep of 9-12% chromium steels. Several alloys with varying composition have been investigated. LÄS MER