Sökning: "atom-probe field-ion microscopy"
Visar resultat 1 - 5 av 19 avhandlingar innehållade orden atom-probe field-ion microscopy.
1. Atom-Probe Field-Ion Microscopy of Electronic Materials
Sammanfattning : This thesis presents work in which atom-probe field-ion microscopy (APFIM) has been applied to two types of electronic materials. In the case of metal/GaAs contacts, the purpose was to characterise the microstructure of the contact interface, particularly the chemical composition variation across the interface. LÄS MER
2. Atom-probe microanalysis of the AuGe/GaAs interface
Sammanfattning : .... LÄS MER
3. Atom Probe Field Ion Microscopy of Surface Zones, Coatings and Interfaces
Sammanfattning : This thesis is focused on developingmethods for high resolution microanalysis of coatings on a substrate, andsurface zones of a bulk sample using atom probe field ion microscopy,APFIM. The APFIM technique is described and some examples of its applications to semiconductors,cemented carbides and intermetallic compounds are given. LÄS MER
4. Precipitation Reactions at High Temperatures in 9-12% Chromium Steels
Sammanfattning : This thesis reports on quantitative investigations of microstructural changes, mainly precipitation reactions, occurring during heat treatment, ageing and creep of 9-12% chromium steels. Several alloys with varying composition have been investigated. LÄS MER
5. High Resolution Microanalysis of Creep Resistant 9-12% Chromium Steels
Sammanfattning : This thesis deals with detailed studies of the microstructure of 9-12% chromium steels. Three alloys with improved creep resistance have been studied in different stages of heat treatment and after creep testing. Two of them were manufactured using PM/HIP and were of the type 10. LÄS MER