Sökning: "YBa2Cu3O6 delta"
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1. Atom-Probe Field-Ion Microscopy of Electronic Materials
Sammanfattning : This thesis presents work in which atom-probe field-ion microscopy (APFIM) has been applied to two types of electronic materials. In the case of metal/GaAs contacts, the purpose was to characterise the microstructure of the contact interface, particularly the chemical composition variation across the interface. LÄS MER
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