Sökning: "Optic measurement"
Visar resultat 36 - 36 av 36 avhandlingar innehållade orden Optic measurement.
36. Atomically Resolved ac-Mode Atomic Force Microscopy in Ultra-High Vacuum
Sammanfattning : When the atomic force microscope (AFM) was invented in 1986, it was anticipated that the technique should be able to produce atomically resolved images with aquality similar to what was routinely obtained with the scanning tunnelling microscope (STM). Even though the AFM quickly became a very popular technique, the development toward ultra-high resolution imaging turned out to be slow due to problems of both fundamental and technical nature. LÄS MER
