Sökning: "Dielectric characterization"
Visar resultat 1 - 5 av 77 avhandlingar innehållade orden Dielectric characterization.
1. Enhancements in Dielectric Response Characterization of Insulation Materials
Sammanfattning : The increasing demand of integrating various renewable energy recourses in power system requires extensive use of power electronic solutions, such as HVDC and FACTS, as these techniques allow energy conversion between different frequencies and serves to stabilize the network. Consequently, electric stresses other than traditional 50/60 Hz sinusoidal voltage stress are acting on high voltage insulation materials. LÄS MER
2. Enhanced Dielectric Response Methods for the Characterization of Dielectric Materials
Sammanfattning : Dielectric response measurement is widely used for condition assessment of high voltage equipment and for characterizing candidate materials. Measurement with high accuracy and reliability is important in all stages of the lifetime of high voltage equipment, from manufacture to replacement decision. LÄS MER
3. High frequency electronic packaging and components : characterization, simulation, materials and processing
Sammanfattning : Electronic packaging continues to move towards improved performance and lower cost. Requirements of higher performance, reduced size, weight and cost of both high density interconnects and high frequency devices have led to the search for new materials, material combinations, methods, processes and production equipment. LÄS MER
4. Partial discharges studied by dielectric response method
Sammanfattning : The increasing demand of integrating various renewable energy recourses in power system requires extensive use of power electronic solutions, which allows energy conversion between different frequencies and stabilizes the system. Consequently, other than the traditional 50/60 Hz sinusoidal voltage stresses act on the high voltage insulation systems. LÄS MER
5. Novel Processing and Electrical Characterization of Nanowires
Sammanfattning : This thesis investigates novel electrical nanowire characterization tools and devices. Conventional characterization methods, long available to bulk semiconductor samples, have been adapted and transferred to the nanowire geometry. LÄS MER