Sökning: "scanning and transmission electron microscopy"
Visar resultat 36 - 40 av 181 avhandlingar innehållade orden scanning and transmission electron microscopy.
36. Protective and Nanoporous Alumina Films Studied in situ by X-ray and Electrochemical Methods
Sammanfattning : In this thesis, the studies of native and anodic oxides on both aluminum model single crystal surfaces as well as on aluminum alloys found in applications are presented. The focus has been on the characterization in situ as the oxide is growing by an electrochemical process called anodization. LÄS MER
37. Insights into wear and deformation of alternative binder hardmetals
Sammanfattning : This work presents new insights into how hardmetals with alternative binders as well as cobalt based references react to wear and deformation. The main focus has been on hardmetals for steel turning, but also on studying certain fundamental properties of the new binder materials. LÄS MER
38. Atomic Layer Deposition and Immobilised Molecular Catalysts Studied by In and Ex Situ Electron Spectroscopy
Sammanfattning : The research work that I describe in my thesis deals with three different heterogenisation approaches for synthesising a heterogeneous transition metal catalyst used for direct C-H activation reactions. The three heterogenisation approaches considered in my research are: (1) heterogenisation of a molecular catalyst on a polymer support using covalent bonds, (2) heterogenisation of a catalyst on a reduced graphene oxide (rGO) support using non-covalent interactions and (3) immobilisation of a catalyst on an inorganic surface using covalent bonds and encapsulation in an inorganic matrix. LÄS MER
39. Influence of combined thermal and mechanical loadings on pearlitic steel microstructure in railway wheels and rails
Sammanfattning : One of the most important aspects in railway operation is the interaction between rail and wheel. The contact patch between these two components is around the size of a small coin, and since high loads act on this small area, stresses will give rise to wear and damage in both components. LÄS MER
40. Characterization of Process-related Defects in Silicon Carbide by Electron Microscopy
Sammanfattning : Silicon carbide (SiC) is a semiconducting material, which provides advantages compared to other available semiconducting materials. Attractive properties of SiC are the wide bandgap (2.2-3.3 eV), high electric breakdown field (3x106 Vcm-1), high thermal conductivity (5 Wcm-1 K-1) and the chemical stabi!ity. LÄS MER
