Sökning: "atomic force microscopy"

Visar resultat 1 - 5 av 249 avhandlingar innehållade orden atomic force microscopy.

  1. 1. Surface interactions and adsorbate structures : An atomic force microscopy study

    Författare :Goran Bogdanovic; KTH; []
    Nyckelord :atomic force microscope; AFM; cantilever calibration; colloidal probe; surface force; force curve; friciton; hydrophobic; adhesion; roughness; multilayer; silica; cellulose; cationic polyelectrolyte; MAPTAC;

    Sammanfattning : Atomic force microscopy, AFM, was used for studying somecurrent topics in the field of surface and colloid science. Themain topics addressed in this thesis were: the nature of thelong-range attraction between hydrophobic surfaces; slidingfriction behavior for microscopic contacts; and interfacialstructuring of polyelectrolyte-nanoparticle multilayerfilms. LÄS MER

  2. 2. Imaging materials with intermodulation : Studies in multifrequency atomic force microscopy

    Författare :Daniel Forchheimer; David Haviland; Arvind Raman; KTH; []
    Nyckelord :ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; atomic force microscopy; nonlinear dynamics; frequency mixing; force reconstruction; Fysik; Physics;

    Sammanfattning : The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. LÄS MER

  3. 3. Investigating nano-scale viscous and elastic forces withintermodulation : Studies in multifrequency atomic force microscopy

    Författare :Per-Anders Thorén; David B. Haviland; Greg Haugstad; KTH; []
    Nyckelord :NATURAL SCIENCES; NATURVETENSKAP; NATURVETENSKAP; NATURAL SCIENCES; Atomic Force Microscopy; Nonlinear dynamics; Soft materials; High- speed friction measurements; Modeling and numerical simulations; Physics; Fysik;

    Sammanfattning : Investigating visco-elastic forces at the nanometer-scale is important to thecharacterization of soft materials. A quantitative force measurement can be ob-tained using an atomic force microscope (AFM) with a calibrated force transducer(the AFM cantilever). LÄS MER

  4. 4. Force measurements using scanning probe microscopy : Applications to advanced powder processing

    Författare :Anders Meurk; KTH; []
    Nyckelord :atomic force microscope; AFM; SPM; van der Waals interaction; DLVO-theory; surface forces; colloidal probe; force curve; friction; adhesion; stick-slip; cantilever; calibration; spring constant; silicon nitride; iron; silica;

    Sammanfattning : The object of this thesis is to apply scanning probemicroscopy (SPM) to the field of advanced powder processing.Measurement of interparticle surface forces at conditionsrelevant to ceramic processing has been performed together withthorough studies of powder friction. LÄS MER

  5. 5. Nanostructures Studied by Atomic Force Microscopy : Ion Tracks and Nanotextured Films

    Författare :Judit Kopniczky; Claes-Göran Granqvist; Lars Montelius; Uppsala universitet; []
    Nyckelord :NATURAL SCIENCES; NATURVETENSKAP; Physics; ion impact; surface tracks; electronic sputtering; WO3; nanoparticle; scanning probe microscopy; tapping mode; Fysik; Physics; Fysik;

    Sammanfattning : The work presented in this thesis concernes two sorts of nanostructures: energetic-ion-impact-induced surface tracks and gas-deposited WO3 nanoparticles. Our aims to characterise these nanostuctures and understand the physical principles behind their formation are of general interests for basic science as well as of the field of nanotechnology. LÄS MER