Sökning: "atomic force microscopy"
Visar resultat 1 - 5 av 249 avhandlingar innehållade orden atomic force microscopy.
Sammanfattning : Atomic force microscopy, AFM, was used for studying somecurrent topics in the field of surface and colloid science. Themain topics addressed in this thesis were: the nature of thelong-range attraction between hydrophobic surfaces; slidingfriction behavior for microscopic contacts; and interfacialstructuring of polyelectrolyte-nanoparticle multilayerfilms. LÄS MER
Sammanfattning : The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. LÄS MER
3. Investigating nano-scale viscous and elastic forces withintermodulation : Studies in multifrequency atomic force microscopy
Sammanfattning : Investigating visco-elastic forces at the nanometer-scale is important to thecharacterization of soft materials. A quantitative force measurement can be ob-tained using an atomic force microscope (AFM) with a calibrated force transducer(the AFM cantilever). LÄS MER
Sammanfattning : The object of this thesis is to apply scanning probemicroscopy (SPM) to the field of advanced powder processing.Measurement of interparticle surface forces at conditionsrelevant to ceramic processing has been performed together withthorough studies of powder friction. LÄS MER
Sammanfattning : The work presented in this thesis concernes two sorts of nanostructures: energetic-ion-impact-induced surface tracks and gas-deposited WO3 nanoparticles. Our aims to characterise these nanostuctures and understand the physical principles behind their formation are of general interests for basic science as well as of the field of nanotechnology. LÄS MER