Sökning: "atomic force microscopy"

Visar resultat 16 - 20 av 263 avhandlingar innehållade orden atomic force microscopy.

1. 16. Atomically Resolved ac-Mode Atomic Force Microscopy in Ultra-High Vacuum

   Författare :Lars Olsson; Franz Giessibl; Linköpings universitet; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

   Sammanfattning : When the atomic force microscope (AFM) was invented in 1986, it was anticipated that the technique should be able to produce atomically resolved images with aquality similar to what was routinely obtained with the scanning tunnelling microscope (STM). Even though the AFM quickly became a very popular technique, the development toward ultra-high resolution imaging turned out to be slow due to problems of both fundamental and technical nature. LÄS MER

3. 17. Mechanical properties of carbon nanotubes and nanofibers

   Författare :Henrik Jackman; Krister Svensson; Pavel Krakhmalev; Håkan Olin; Karlstads universitet; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; atomic force microscopy; bending; carbon nanotubes; deformation; scanning electron microscopy; Young s modulus; carbon nanofibers; mechanical properties; Physics; Fysik;

   Sammanfattning : Carbon nanotubes (CNTs) have extraordinary electrical and mechanical properties, and many potential applications have been proposed, ranging from nanoscale devices to reinforcement of macroscopic structures. However, due to their small sizes, characterization of their mechanical properties and deformation behaviours are major challenges. LÄS MER

4. 18. Near-field scanning optical microscopy and fractal characterization with atomic force microscopy and other methods

   Författare :Anders Mannelquist; Luleå tekniska universitet; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Fysik; Fysik;

   Sammanfattning : This thesis is devoted to the development of near-field scanning optical microscopy (NSOM) for aqueous solutions and to fractal characterization of steel surfaces with atomic force microscopy (AFM) and other methods. NSOM combines optical properties from a light microscope and the technique of scanning probe microscopy, SPM (invented in the early 1980’s). LÄS MER

5. 19. Growth and characterization of SiC and GaN

   Författare :Rafal Ciechonski; Erik Janzén; Sebastian Lourdudoss; Linköpings universitet; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; SiC; GaN; Deep level transient spectroscopy; Minority Carrier Transient Spectroscopy; Hall effect; Cathodoluminescence; Scanning electron microscopy; Atomic Force microscopy; sublimation growth; MOCVD; heterostructures; High Electron Mobility transistor; point defects; Material physics with surface physics; Materialfysik med ytfysik;

   Sammanfattning : At present, focus of the SiC crystal growth development is on improving the crystalline quality without polytype inclusions, micropipes and the occurrence of extended defects. The purity of the grown material, as well as intentional doping must be well controlled and the processes understood. LÄS MER

7. 20. Ultrastructural arrangement of the polymers in wood fibres

   Författare :Jesper Fahlén; KTH; []
   Nyckelord :Atomic force microscopy; Picea abies; Lamellar structure; Scanning electron microscopy; Fracture; Fibril; Kraft pulping; Ultrastructure; Image processing; Secondary wall;

   Sammanfattning : .... LÄS MER