Sökning: "David Haviland"
Visar resultat 1 - 5 av 14 avhandlingar innehållade orden David Haviland.
1. Probing nonlinear electrical properties at the nanoscale : Studies in multifrequency AFM
Sammanfattning : Nanostructured materials promise great advances in diverse and active research fields such as energy harvesting and storage, corrosion prevention and high-density memories. Electrical characterization at the nanometer scale is key to understanding and optimizing the performance of these materials, and therefore central to the progress of nanotechnology. LÄS MER
2. Quantum effects in nanoscale Josephson junction circuits
Sammanfattning : This thesis presents the results of an experimental study on single-charge effects in nanoscale Josephson junctions and Cooper pair transistors (CPTs). In nanoscale Josephson junctions the charging energy EC becomes significant at sub-Kelvin temperatures and single-charge effects, such as the Coulomb blockade of Cooper pair tunneling, influence the transport properties. LÄS MER
3. Fabrication and Characterization of Superconductive Coplanar Waveguide Resonators : Fabrication and Characterization of Superconductive Coplanar Waveguide Resonators
Sammanfattning : The objective of this thesis is to evaluate a generic process for fabrication and characterization of the Superconductive coplanar waveguide (CPW) resonators. Superconductive CPW resonators with various lengths and shapes are designed to investigate their electrical and magnetic properties as well as resonance properties and sensitivities. LÄS MER
4. Nonlinear dynamics of Josephson Junction Chains and Superconducting Resonators
Sammanfattning : This thesis presents the results of the experimental studies on two kindof Superconducting circuits: one-dimensional Josephson junction chains andsuperconducting coplanar waveguide (CPW) resonators. One-dimensionalJosephson junction chains are constructed by connecting many Superconducting quantum interference devices (SQUIDs) in series. LÄS MER
5. Imaging materials with intermodulation : Studies in multifrequency atomic force microscopy
Sammanfattning : The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. LÄS MER