Sökning: "ToF-MEIS"

Hittade 3 avhandlingar innehållade ordet ToF-MEIS.

  1. 1. Electronic excitation, luminescence and particle emission : Studying ion-induced phenomena in ToF-MEIS

    Författare :Svenja Lohmann; Daniel Primetzhofer; Friedrich Aumayr; Uppsala universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; TOF-MEIS; ion beam analysis; deep UV; desorption; electronic sputtering; TiN;

    Sammanfattning : Medium energy ion scattering (MEIS) is an experimental technique for the high-resolution depth profiling of thin films. Commonly, ions with energies between several ten to a few hundred keV are employed as probes, and backscattered particles are detected. LÄS MER

  3. 2. Beyond scattering – what more can be learned from pulsed keV ion beams?

    Författare :Svenja Lohmann; Daniel Primetzhofer; Andreas Wucher; Uppsala universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Charge exchange; Deep UV photons; Electron emission; Silicon; Sputtering; TOF-MEIS; Fysik; Physics;

    Sammanfattning : Interactions of energetic ions with matter govern processes as diverse as the influence of solar wind, hadron therapy for cancer treatment and plasma-wall interactions in fusion devices, and are used for controlled manipulation of materials properties as well as analytical methods. The scattering of ions from target nuclei and electrons does not only lead to energy deposition, but can induce the emission of different secondary particles including electrons, photons, sputtered target ions and neutrals as well as nuclear reaction products. LÄS MER

  4. 3. New aspects of electronic interactions of keV ions with matter

    Författare :Barbara Bruckner; Daniel Primetzhofer; Peter Bauer; Marika Schleberger; Uppsala universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; ToF-MEIS; LEIS; electronic stopping; charge exchange; scattering potential; Fysik; Physics;

    Sammanfattning : Low- and medium-energy ion scattering are powerful techniques to perform high-resolution depth profiling with sub-nanometer resolution. Typically, ions with primary energies between a few keV and a few hundred keV are used to probe the sample and backscattered projectiles are detected. LÄS MER