Sökning: "ION BEAM ANALYSIS"
Visar resultat 6 - 10 av 96 avhandlingar innehållade orden ION BEAM ANALYSIS.
6. Case Studies in Ion Beam Assisted Nanostructure Engineering
Sammanfattning : Beams of energetic ions can be used for material analysis and modification. It provides us with a tool featuring unique control over the area, depth and amount of damage in the material. This property of ion beams can be used to generate desired changes in material properties or form nanostructures with specific characteristics in the material. LÄS MER
7. Development of Techniques for 3D Imaging with Focused Ion Beams - Hydrogen Depth Profiling and Microtomography with Applications in Geology
Sammanfattning : In nuclear microprobe experiments, high resolution maps of the measured parameter, e.g. element- or mass distribution, in a sample can be produced with a variety of ion beam analytical techniques. The principle underlying all the techniques is that ions at MeV energies are used as projectiles to cause interactions with the target material. LÄS MER
8. Electronic excitation, luminescence and particle emission : Studying ion-induced phenomena in ToF-MEIS
Sammanfattning : Medium energy ion scattering (MEIS) is an experimental technique for the high-resolution depth profiling of thin films. Commonly, ions with energies between several ten to a few hundred keV are employed as probes, and backscattered particles are detected. LÄS MER
9. Investigation of lithium and fluorine content in geological materials using Nuclear Reaction Analysis (NRA)
Sammanfattning : This work focuses on the optimization of the Nuclear Reaction Analysis (NRA) technique to determine the content of lithium and fluorine in geological materials. Measuring low concentration of these isotopes is of great relevance in many fields such as geological, astrophysical, biological and material sciences. LÄS MER
10. Transmission Electron Microscopy of Graphene and Hydrated Biomaterial Nanostructures : Novel Techniques and Analysis
Sammanfattning : Transmission Electron Microscopy (TEM) on light element materials and soft matters is problematic due to electron irradiation damage and low contrast. In this doctoral thesis techniques were developed to address some of those issues and successfully characterize these materials at high resolution. LÄS MER