Sökning: "Sputter growth"
Visar resultat 1 - 5 av 43 avhandlingar innehållade orden Sputter growth.
1. Growth and Magnetic Properties of Fe- and FeNi-based Thin Films and Multilayers
Sammanfattning : This thesis concerns the growth and magnetic properties of thin films and multilayers. The samples were grown by magnetron sputtering, and characterized structurally mainly by x-ray diffraction and reflectivity. LÄS MER
2. Thin metal films on weakly-interacting substrates : Nanoscale growth dynamics, stress generation, and morphology manipulation
Sammanfattning : Vapor-based growth of thin metal films with controlled morphology on weakly-interacting substrates (WIS), including oxides and van der Waals materials, is essential for the fabrication of multifunctional metal contacts in a wide array of optoelectronic devices. Achieving this entails a great challenge, since weak film/substrate interactions yield a pronounced and uncontrolled 3D morphology. LÄS MER
3. Growth and microstructure of reactive sputter deposited boron nitride : carbon (BN:C) thin films
Sammanfattning : Growth, microstructure and mechanical properties of boron nitride: carbon (BN:C) have been studied in films prepared by reactive r.f. diode sputter deposition as well as by reactive unbalanced d.c. LÄS MER
4. Reactive Sputtering of Cubic-Phase BN:C and Nanostructured B-N-C Films : Growth, Microstructure, and Mechanical Properties
Sammanfattning : Synthesis, structure, and mechanical property related issues in the carbon-containing boron nitride (BN:C) system have been studied. Magnetron sputtering, comprising a B4C target in mixed Ar-N2 discharges and deposition parameters of low ion energy, high ion-to-neutral flux ratio, and substrate temperatures ... LÄS MER
5. Magnetron Sputter Epitaxy of GaN
Sammanfattning : Electronic-grade GaN (0001) epilayers have been grown directly on Al2O3 (0001) substrates by reactive DC-magnetron sputter epitaxy (MSE) from a liquid Ga sputtering target in an Ar/N2 atmosphere. The as-grown GaN epitaxial film exhibit low threading dislocation density on the order of ≤ 1010 cm-2 obtained by transmission electron microscopy and modified Williamson-Hall plot. LÄS MER