Sökning: "high resolution materials analysis"

Visar resultat 1 - 5 av 96 avhandlingar innehållade orden high resolution materials analysis.

  1. 1. High-Resolution Studies of Silicide-films for Nano IC-Components

    Författare :Tobias Jarmar; Fredric Ericson; Ulf Smith; Terje Finstad; Uppsala universitet; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Materials science; thin films; titaniumsilicide; nickel-germanosilicide; ternary phase diagram; textured germanosilicide; high resolution materials analysis; Materialvetenskap; Materials science; Teknisk materialvetenskap;

    Sammanfattning : The function of titanium- and nickel-silicides is to lower the series resistance and contact resistivity in gate, source and drain contacts of an integrated circuit transistor. With decreasing dimensions, the low resistivity C54 TiSi2 is not formed and stays in its high resistivity phase C49. LÄS MER

  3. 2. Acceptor-Doped BaZrO3 Perovskite: Synthesis, Structure and Proton Conductivity

    Författare :Istaq Ahmed; Chalmers tekniska högskola; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; NATURVETENSKAP; NATURAL SCIENCES; Impedance spectroscopy; Perovskite; Neutron diffraction; Rietveld refinement; BaZrO3.; Proton conductor;

    Sammanfattning : Acceptor-doped perovskite oxides exhibit significant proton conductivity in hydrogen containing atmospheres. Therefore, they have potential for use as separator materials for various electrochemical devices including gas sensors, electrolysers and fuel cells. LÄS MER

  4. 3. Transmission Electron Microscopy of Graphene and Hydrated Biomaterial Nanostructures : Novel Techniques and Analysis

    Författare :Sultan Akhtar; Klaus Leifer; Hilborn Jöns; Stefano Rubino; Marco Cantoni; Uppsala universitet; []
    Nyckelord :Graphene flakes; magnetic beads DNA coils; hydrated biomaterials; transmission electron microscopy; focused ion beam scanning electron microscopy; bright-field dark-field imaging; high resolution imaging; electron diffraction and cryogenic temperatures; Materialvetenskap; Materials Science;

    Sammanfattning : Transmission Electron Microscopy (TEM) on light element materials and soft matters is problematic due to electron irradiation damage and low contrast. In this doctoral thesis techniques were developed to address some of those issues and successfully characterize these materials at high resolution. LÄS MER

  5. 4. Atom Probe Tomography of Hard Nitride and Boride Thin Films

    Författare :David L. J. Engberg; Lars Hultman; Magnus Odén; Guido Schmitz; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Materials science; Atom probe tomography APT ; Ceramics; Nitrides; Borides;

    Sammanfattning : Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. LÄS MER

  7. 5. Stacking faults, deformation-induced martensite and micromechanics of metastable austenite in steels studied by high-energy synchrotron X-ray diffraction

    Författare :Benjamin Neding; Peter Hedström; Dmytro Orlov; KTH; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; austenitic stainless steel; deformation-induced martensitic transformation; stacking fault energy; high-energy X-ray diffraction; HEXRD; high-energy X-ray diffraction microscopy; HEDM; medium Mn steel; Teknisk materialvetenskap; Materials Science and Engineering;

    Sammanfattning : Austenitic stainless steels are known for their remarkable corrosion resistance and exhibit a very high ductility and toughness. They posses the face centered cubic crystal structure. LÄS MER