Sökning: "test generation"

Visar resultat 1 - 5 av 397 avhandlingar innehållade orden test generation.

1. 1. Automatic test generation for industrial control software

   Författare :Eduard Enoiu; Daniel Sundmark; Mats Heimdahl; Mälardalens högskola; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; automatic test generation; software testing; automated test generation; Computer Science; datavetenskap;

   Sammanfattning : Since the early days of software testing, automatic test generation has been suggested as a way of allowing tests to be created at a lower cost. However, industrially useful and applicable tools for automatic test generation are still scarce. LÄS MER

3. 2. Hybrid Built-In Self-Test and Test Generation Techniques for Digital Systems

   Författare :Gert Jervan; Zebo Peng; Linköpings universitet; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Datavetenskap; system-on-chip; test generation; BIST; hybrid BIST; high-level test; Datavetenskap; Computer science; Datavetenskap;

   Sammanfattning : The technological development is enabling the production of increasingly complex electronic systems. All such systems must be verified and tested to guarantee their correct behavior. As the complexity grows, testing has become one of the most significant factors that contribute to the total development cost. LÄS MER

4. 3. Thermal Issues in Testing of Advanced Systems on Chip

   Författare :Nima Aghaee Ghaleshahi; Zebo Peng; Petru Eles; Jaan Raik; Linköpings universitet; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; SoC test; test scheduling; Adaptive test; Temperature awareness; Process variation; Thermal simulation; 3D stacked IC 3DSIC test; Burn-in; Temperature gradients; Temperature Cycling Test; Test Ordering;

   Sammanfattning : Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. LÄS MER

5. 4. High-Level Test Generation and Built-In Self-Test Techniques for Digital Systems

   Författare :Gert Jervan; Zebo Peng; Linköpings universitet; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Digital technique; electronic systems; test vectors; testability; built-in self-test architecture; Computer science; Datavetenskap;

   Sammanfattning : The technological development is enabling production of increasingly complex electronic systems. All those systems must be verified and tested to guarantee correct behavior. As the complexity grows, testing is becoming one of the most significant factors that contribute to the final product cost. LÄS MER

7. 5. On logic test generation : algorithms and methods for combinational test generation

   Författare :Hans Kristian Wiklund; Chalmers tekniska högskola; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; bridging faults; switchh level; binary decision diagrams; testability; feedback; ATPG;

   Sammanfattning : .... LÄS MER