Sökning: "spectroscopic ellipsometry"

Visar resultat 1 - 5 av 27 avhandlingar innehållade orden spectroscopic ellipsometry.

  1. 1. Optical characterization of wide band gap materials by spectroscopic ellipsometry

    Författare :O. P. Alexander Lindquist; Linköpings universitet; []
    Nyckelord :Wide Band Gap materials; ellipsometry; SiC; GaN;

    Sammanfattning : Spectroscopic ellipsometry has been employed in the study of wide band gap materials. Ellipsometry is based on the study of changes in the polarization state of light upon reflection on a surface. LÄS MER

  3. 2. New methodology for optical sensing and analysis

    Författare :Jimmy W. P. Bakker; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Applied Optics; measuring; ellipsometry; fluorescence; spectroscopic ellipsometry; Optics; Optik;

    Sammanfattning : This thesis describes the research I have done, and partly will do, during my time as a PhD student in the laboratory of Applied Optics at Linköping University. Due to circumstances beyond the scope of this book, this incorporates three quite different projects. LÄS MER

  4. 3. Optical Modeling and Characterization of Layers and Multilayer Structures : Organic Optoelectronic Devices and Spectroscopic Ellipsometry

    Författare :Leif A. A. Pettersson; Robert W. Collins; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

    Sammanfattning : This dissertation is on the subject of modeling and characterization of layers and multilayer structures with respect to their optical properties and characteristics. A number of different systems have been investigated; among them multilayer structures in the form of organic optoelectronic devices, anisotropic layers of conjugated polymers as well as inhomogeneous layers of porous silicon and oxidized silver. LÄS MER

  5. 4. Total internal reflection ellipsometry : principles and applications

    Författare :Michal Poksinski; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

    Sammanfattning : Spectroscopic ellipsometry has been used under conditions of total internal reflection to form a new measurement technique called Total Internal Reflection Ellipsometry. When measurement settings are appropriate for surface plasmon resonance to occur it is possible to combine the advantages of both ellipsometry and surface plasmon resonance and obtain very high sensitivity and precision. LÄS MER

  7. 5. Total internal reflection ellipsometry

    Författare :Michal Poksinski; Uwe´ Beck; Linköpings universitet; []
    Nyckelord :NATURAL SCIENCES; NATURVETENSKAP;

    Sammanfattning : This thesis summarizes the work performed on the development and implementation of the optical measurement technique called total internal reflection ellipsometry (TIRE).The TIRE principle is based on spectroscopic ellipsometry performed under conditions of total internal reflection. LÄS MER