Sökning: "scanning tunneling microscopy"
Visar resultat 11 - 15 av 70 avhandlingar innehållade orden scanning tunneling microscopy.
11. Semiconductor Nanowires: Characterization and surface modification
Sammanfattning : The topic of III-V nanowires is still, after more than two decades, a growing and lively research area. The areas of application are wide and contain such important topics as energy harvesting, cheap and efficient lighting, high efficiency detectors and new types of electronics. III-V materials offer properties superior to the widely used Si. LÄS MER
12. Scanning Probe Microscopy: Design and Applications
Sammanfattning : A compact scanning tunneling microscope (STM) and a scanning ion-conductance microscope (SICM) has been constructed. The concentric microscope head was built around a commercial piezoelectric inchworm motor that was used for coarse positioning. The microscope has a high resonance frequency (9.6 kHz), low noise (0. LÄS MER
13. Atomic Scale Characterization of III-V Nanowire Surfaces
Sammanfattning : This dissertation focus on the atomic-scale characterization of the surface properties and electronic structure of III–V semiconductor nanowires (NWs). Since the early 2000s, the fabrication and characterization of III–V NWs has been a very significant topic within material science due to their potential for applications in lighting, energy harvesting, and electronics. LÄS MER
14. Theoretical investigations of scanning tunneling microscopy of adsorbates on metal surfaces
Sammanfattning : .... LÄS MER
15. Scanning tunneling microscopy and photoemission studies of Ag films on metal/semiconductor surfaces
Sammanfattning : The research presented in this thesis has been focused on the study of thin Ag films, grown on metal-reconstructed Si(111) and Ge(111) surfaces.The films have been grown at room temperature, and the morphologiesand electronic structures of the films have been investigated using scanning tunneling microscopy and spectroscopy (STM/STS), low-energy electron diffraction (LEED) and angle-resolved photoelectron spectroscopy(ARPES). LÄS MER