Sökning: "scanning probe microscopy"
Visar resultat 11 - 15 av 92 avhandlingar innehållade orden scanning probe microscopy.
11. Carbides in martensitic medium carbon low alloyed tool steels studied with small angle scattering techniques, electron microscopy and atom probe tomography
Sammanfattning : Medium carbon low alloyed tool steels are used today in various areas to shape plastics, nonferrous metals, and steels, and they are crucial in the manufacturing industry. To be effective, tool steels must be strong and tough, and have high wear resistance and temperature stability. LÄS MER
12. Near-field scanning optical microscopy and fractal characterization with atomic force microscopy and other methods
Sammanfattning : This thesis is devoted to the development of near-field scanning optical microscopy (NSOM) for aqueous solutions and to fractal characterization of steel surfaces with atomic force microscopy (AFM) and other methods. NSOM combines optical properties from a light microscope and the technique of scanning probe microscopy, SPM (invented in the early 1980’s). LÄS MER
13. Scanning probe microscopy studies of interaction forces between particles: emphasis on magnetite, bentonite and silica
Sammanfattning : Scanning probe microscopy (SPM), such as the atomic force microscope (AFM), using colloidal probes is a highly suitable technique to probe single particle-particle interactions in aqueous solution. The interaction force between a colloidal probe on the AFM cantilever and sample surface is measured. LÄS MER
14. Atomic Scale Characterization of III-V Nanowire Surfaces
Sammanfattning : This dissertation focus on the atomic-scale characterization of the surface properties and electronic structure of III–V semiconductor nanowires (NWs). Since the early 2000s, the fabrication and characterization of III–V NWs has been a very significant topic within material science due to their potential for applications in lighting, energy harvesting, and electronics. LÄS MER
15. Towards the Integration of Carbon nanostructures into CMOS technology
Sammanfattning : Relentless efforts for miniaturization of traditional complementary metal oxide semiconductor (CMOS) devices have reached the limit where the device characteristics are governed by quantum phenomena which are difficult to control. This engendered a need for finding alternative new materials that can be engineered to fabricate devices that will possess at least the same or even better performance than existing CMOS devices. LÄS MER