Sökning: "scanning methodologies"

Visar resultat 1 - 5 av 21 avhandlingar innehållade orden scanning methodologies.

1. 1. Tailoring structure and morphology during additive manufacturing of metallic components

   Författare :Jithin James Marattukalam; Björgvin Hjörvarsson; Ulf Jansson; Martin Sahlberg; Lars Nyborg; Uppsala universitet; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Selective laser melting; process parameters; scanning methodologies; AMLOYZR01; bulk metallic glass; 316L SS; grain orientation;

   Sammanfattning : The work described in this thesis explores the use of laser process parameters to functionalize the material properties by the control of microstructure and optimization of morphology in components by selective laser melting. The microstructure in amorphous and crystalline metallic alloy systems is influenced by changing the laser power density and scanning strategies respectively. LÄS MER

3. 2. On Deterministic feature-based Surface Analysis

   Författare :Vijeth Venkataram Reddy; Bengt Göran Rosén; Cecilia Anderberg; Högskolan i Halmstad; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Regression; Coherence Scanning Interferometer; Characterization; Manufacturing; Stylus Profilometer; Areal surface parameters; Surface profile parameters.;

   Sammanfattning : Manufacturing sector is continuously identifying opportunities to streamline production, reduce waste and improve manufacturing efficiency without compromising product quality. Continuous improvement has been the primary objective to produce acceptable quality products and meet dynamic customer demands by using advanced techniques and methods. LÄS MER

4. 3. On Characterization and Optimization of Engineering Surfaces

   Författare :Vijeth Venkataram Reddy; Chalmers tekniska högskola; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Stylus Profilometer; Manufacturing; Coherence Scanning Interferometer; Regression; Areal surface parameters; Characterization; Functional surfaces; Surface profile parameters;

   Sammanfattning : Swedish manufacturing industry in collaboration with academia is exploring innovative ways to manufacture eco-efficient and resource efficient products. Consequently, improving manufacturing efficiency and quality has become the priority for the manufacturing sector to remain competitive in a sustainable way. LÄS MER

5. 4. On Surface Characteristics and Microstructural Development of Soft Magnetic Composite Powder and Components

   Författare :Christos Oikonomou; Chalmers tekniska högskola; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; X-ray photoelectron spectroscopy; compaction; annealing; X-ray diffraction; soft magnetic composites; high resolution scanning electron microscopy; surface layers; magnetic testing; powder metallurgy; depth profiling; electron backscatter diffraction; focused ion beam; thickness determination; energy dispersive X-ray spectroscopy; microstructure;

   Sammanfattning : Soft Magnetic Composite (SMC) products manufactured by traditional Powder Metallurgical (PM) techniques, are strong candidate materials for electromagnetic applications. Their advantages are based on cost and energy efficient production methods, shape complexity realization and uniquely uniform and isotropic three dimensional (3D) magnetic properties. LÄS MER

7. 5. Characterization of components and materials for EMC barriers

   Författare :Urban Lundgren; Luleå tekniska universitet; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Industrial Electronics; Industriell elektronik;

   Sammanfattning : This thesis presents contributions to work for better methodologies for addressing Electromagnetic Compatibility (EMC) issues. In particular measurement methods are reviewed and devised for acquiring data on barriers used for EMC. Such data is used for characterization, modeling and model verification of barriers. LÄS MER