Sökning: "reflection high energy electron diffraction RHEED"

Hittade 4 avhandlingar innehållade orden reflection high energy electron diffraction RHEED.

  1. 1. Molecular Beam Epitaxy and Characterisation of GaN-compounds on GaAs(001) and Sapphire(0001)

    Författare :Otto Zsebök; Chalmers tekniska högskola; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; AlGaN GaN HFET; plasma-assisted MBE; GaNAs; nitridation damage; InGaN; group-III nitrides; GaN; AlGaN; phase-separation;

    Sammanfattning : The hexagonal (wurtzite) and the cubic (zinc blende) group-III nitrides and their heterostructures have attracted much attention due to their potential for applications in high-power, high-frequency electronic and optoelectronic devices. The optical emission range of the GaN-based alloys cover the whole visible range from near infrared (IR) to ultraviolet (UV). LÄS MER

  3. 2. Non-equilibrium Surfaces of Metallic Thin Films

    Författare :Erik B. Svedberg; Eric E. Fullerton; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

    Sammanfattning : Growth and structural characterization of metallic multilayers have been performed on the Mo/W, Mo/V and Ag/Ni systems utilizing magnetron sputtering under ultra-high-vacuum deposition conditions. Structural characterization has been performed both in situ and ex situ with several electron beam probing techniques as well as x-ray diffraction. LÄS MER

  4. 3. Growth and characterization of TiN/SiNx multilayer thin films

    Författare :Hans Söderberg; Luleå tekniska universitet; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Engineering Materials; Materialteknik;

    Sammanfattning : The demands from industry for higher cutting speeds, feeding rates, and reduction of the use of cooling agents during turning and milling operations are increasing. Consequently the requirements on the cutting inserts are increasing and new advanced coatings that can withstand the higher temperatures and larger loads are highly sought after. LÄS MER

  5. 4. STM studies of overlayers on semiconductor or insulator surfaces

    Författare :Thorbjörn Jemander; Struan Gray; Linköpings universitet; []
    Nyckelord :;

    Sammanfattning : Scanning tunneling microscopy (STM) operated in ultra-high vacuum (UHV) has been used to study overlayers on semiconductor or insulator surfaces. The overlayers have been deposited by magnetron sputtering, thermal evaporation or by gas exposure, and the investigated material systems include Mo on MgO, Ni on SiC, Sn on Si(lll), C on Si(lO0) and O on Si(lll). LÄS MER