Sökning: "industrial metrology"

Visar resultat 1 - 5 av 14 avhandlingar innehållade orden industrial metrology.

  1. 1. Exploiting the Terahertz Spectrum with Silicon Micromachining : Waveguide Components, Systems and Metrology

    Författare :James Campion; Joachim Oberhammer; Umer Shah; Robert M. Weikle II; KTH; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Terahertz; Silicon Micromachining; Waveguide; Waveguide System; Metrology; Electrical Engineering; Elektro- och systemteknik;

    Sammanfattning : The terahertz spectrum (300 GHz - 3 THz) represents the final frontier for modern electronic and optical systems, wherein few low-cost, volume-manufacturable solutions exist. THz frequencies are of great scientific and commercial interest, with applications as diverse as radio astronomy, sensing and imaging and wireless communications. LÄS MER

  3. 2. Epitaxial Graphene Technology for Quantum Metrology

    Författare :Thomas Yager; Chalmers tekniska högskola; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; charge neutrality; optical microscopy; Epitaxial graphene; resistance metrology; silicon carbide; quantum Hall effect; electron transport; bilayer graphene;

    Sammanfattning : Graphene grown on silicon carbide by high-temperature annealing (SiC/G) is a strong contender in the race towards large-scale graphene electronics applications. The unique electronic properties of this system lead to a remarkably robust and accurate Hall resistance quantisation of 0. LÄS MER

  4. 3. Physics-based modelling and measurement of advanced manufacturing machinery’s positioning accuracy : Machine tools, industrial manipulators and their positioning accuracy

    Författare :Nikolas Alexander Theissen; Andreas Archenti; Edward P. Morse; KTH; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Machine tools; Industrial robots; Accuracy; Measurement instruments; Production Engineering; Industriell produktion;

    Sammanfattning : Advanced manufacturing machinery is a corner stone of essential industries of technologicallydeveloped societies. Their accuracy permits the production of complexproducts according to tight geometric dimensions and tolerances for high efficiency,interchangeability and sustainability. LÄS MER

  5. 4. Molecular Doping of Epigraphene for Device Applications

    Författare :Hans He; Chalmers tekniska högskola; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; NATURVETENSKAP; NATURAL SCIENCES; Molecular Doping; Graphene; epitaxial graphene; THz; Metrology; Hall Effect;

    Sammanfattning : Epitaxial graphene grown on silicon carbide, or epigraphene, offers in principle a suitable platform for electronic applications of graphene which require scalable, reproducible, and high-quality material. However, one of the main drawbacks of epigraphene lies in the difficulty in controlling its carrier density, which hinders its usefulness in future applications. LÄS MER

  7. 5. Improved inspection and micrometrology of embedded structures in multi-layered ceramics : Development of optical coherence tomographic methods and tools

    Författare :Rong Su; Lars Mattsson; Peter Ekberg; Jerzy Pluciński; KTH; []
    Nyckelord :Metrology; Optical Coherence Tomography; Ceramics; Embedded Structure; Multilayer; Nondestructive Testing; Optical Inspection; Critical Dimension Measurement; Infrared Imaging; Scattering; Mie Calculation; Image Processing; Monte Carlo Simulation; 测量学， 光学相干断层扫描术，陶瓷，嵌入式结构，多层，无损检测，光学检测，关键尺寸测量，红外成像，散射，Mie计算，图像处理，Monte Carlo模拟; SRA - Production; SRA - Produktion;

    Sammanfattning : Roll-to-roll manufacturing of micro components based on advanced printing, structuring and lamination of ceramic tapes is rapidly progressing. This large-scale and cost-effective manufacturing process of ceramic micro devices is however prone to hide defects within the visually opaque tape stacks. LÄS MER