Sökning: "impurities and defects"
Visar resultat 1 - 5 av 54 avhandlingar innehållade orden impurities and defects.
1. Large and rare : An extreme values approach to estimating the distribution of large defects in high-performance steels
Sammanfattning : The presence of different types of defects is an important reality for manufacturers and users of engineering materials. Generally, the defects are either considered to be the unwanted products of impurities in the raw materials or to have been introduced during the manufacturing process. LÄS MER
2. Defects and Impurities in CdTe : An ab Initio Study
Sammanfattning : In this thesis defects and impurities in CdTe have been studied with ab initio methods. CdTe is a II-VI semiconductor with many important applications such as γ- and X-ray detectors, solar cells and medical imaging. LÄS MER
3. Growth and characterization of SiC and GaN
Sammanfattning : At present, focus of the SiC crystal growth development is on improving the crystalline quality without polytype inclusions, micropipes and the occurrence of extended defects. The purity of the grown material, as well as intentional doping must be well controlled and the processes understood. LÄS MER
4. Influence of defects and impurities on the properties of 2D materials
Sammanfattning : Graphene, the thinnest material with a stable 2D structure, is a potential alternative for silicon-based electronics. However, zero band gap of graphene causes a poor on-off ratio of current thus making it unsuitable for logic operations. This problem prompted scientists to find other suitable 2D materials. LÄS MER
5. Graphene field-effect transistors and devices for advanced high-frequency applications
Sammanfattning : New device technologies and materials are continuously investigated, in order to increase the bandwidth of high-speed electronics, thereby extending data rate and range of applications. The 2D-material graphene, with its intrinsically extremely high charge carrier velocity, is considered as a promising new channel material for advanced high frequency field-effect transistors. LÄS MER