Sökning: "implantation induced pas"
Hittade 2 avhandlingar innehållade orden implantation induced pas.
1. Capacitance Spectroscopy of Point Defects in Silicon and Silicon Carbide
Sammanfattning : .... LÄS MER
2. Hydrogen diffusion and ion implantation in silicon carbide
Sammanfattning : Secondary ion mass spectrometry (SIMS) has been employed tostudy the spatial distributions resulting from mass transportby diffusion and ion implantation in single crystal siliconcarbide (SiC). By a systematic analysis of this data,fundamental processes that govern these phenomena have beenderived. LÄS MER
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