Sökning: "high-resolution depth profiling"

Visar resultat 1 - 5 av 14 avhandlingar innehållade orden high-resolution depth profiling.

  1. 1. On Surface Characteristics and Microstructural Development of Soft Magnetic Composite Powder and Components

    Författare :Christos Oikonomou; Chalmers tekniska högskola; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; X-ray photoelectron spectroscopy; compaction; annealing; X-ray diffraction; soft magnetic composites; high resolution scanning electron microscopy; surface layers; magnetic testing; powder metallurgy; depth profiling; electron backscatter diffraction; focused ion beam; thickness determination; energy dispersive X-ray spectroscopy; microstructure;

    Sammanfattning : Soft Magnetic Composite (SMC) products manufactured by traditional Powder Metallurgical (PM) techniques, are strong candidate materials for electromagnetic applications. Their advantages are based on cost and energy efficient production methods, shape complexity realization and uniquely uniform and isotropic three dimensional (3D) magnetic properties. LÄS MER

  3. 2. Surface Characterization of Soft Magnetic Composite Powder and Compacts

    Författare :Christos Oikonomou; Chalmers tekniska högskola; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; X-ray photoelectron spectroscopy XPS ; energy dispersive X-ray spectroscopy EDX ; surface layers; thickness determination; powder metallurgy PM ; soft magnetic composites SMC ; focused ion beam FIB ; depth profiling; high resolution scanning electron microscopy HR SEM ;

    Sammanfattning : .... LÄS MER

  4. 3. Development of Techniques for 3D Imaging with Focused Ion Beams - Hydrogen Depth Profiling and Microtomography with Applications in Geology

    Författare :Marie Wegdén; Kärnfysik; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Hydrogen analysis; Depth profiling; Ion beam analysis; Nuclear microprobe; Physics; Nuclear physics; Fysik; Fysicumarkivet A:2007:Wegdén; Kärnfysik; Tomography; 3D Imaging;

    Sammanfattning : In nuclear microprobe experiments, high resolution maps of the measured parameter, e.g. element- or mass distribution, in a sample can be produced with a variety of ion beam analytical techniques. The principle underlying all the techniques is that ions at MeV energies are used as projectiles to cause interactions with the target material. LÄS MER

  5. 4. Synthesis and In Situ ToF-LEIS Analysis of Ultrathin Silicides and Ti-based Films

    Författare :Philipp Mika Wolf; Daniel Primetzhofer; Zhen Zhang; Eduardo Pitthan; Tuan Thien Tran; Anders Hallén; Uppsala universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; ion scattering; in situ characterization; nickel silicide; ultrathin metal silicide; epitaxial silicide; surface analysis; titanium based films; high-resolution depth profiling;

    Sammanfattning : Thin films and coatings play a significant role in today’s society, with applications in electronics, optics, mechanics, and biomedicine. Further advancement in the field of surface coatings requires a good understanding of the unique features of ultrathin films and surfaces, which can only be reached with analysis techniques capable of resolving composition and morphology on a sub-nm scale. LÄS MER

  7. 5. Depth Profiling of the Passive Layer on Stainless Steel using Photoelectron Spectroscopy

    Författare :Wendy Fredriksson; Kristina Edström; Fredrik Björefors; Sannakaisa Virtanen; Uppsala universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; depth profile; stainless steel; passive film; XPS; HAXPES; corrosion; powder metallurgical; Kemi med inriktning mot materialkemi; Chemistry with specialization in Materials Chemistry;

    Sammanfattning : The physical properties of the protective passive films formed on the surface of stainless steels under electrochemical polarization in different electrolytes were studied. The structure of these films was analyzed as a function of depth using photoelectron spectroscopy (PES). LÄS MER