Sökning: "high frequency characterization"
Visar resultat 11 - 15 av 229 avhandlingar innehållade orden high frequency characterization.
11. III-V Nanowire MOSFET High-Frequency Technology Platform
Sammanfattning : This thesis addresses the main challenges in using III-V nanowireMOSFETs for high-frequency applications by building a III-Vvertical nanowire MOSFET technology library. The initial devicelayout is designed, based on the assessment of the current III-V verticalnanowire MOSFET with state-of-the-art performance. LÄS MER
12. Low-frequency noise in high-k gate stacks with interfacial layer engineering
Sammanfattning : The rapid progress of complementary-metal-oxide-semiconductor (CMOS) integrated circuit technology became feasible through continuous device scaling. The implementation of high-k/metal gates had a significantcontribution to this progress during the last decade. However, there are still challenges regarding the reliability of these devices. LÄS MER
13. Electromagnetic characterization of power electronic systems
Sammanfattning : Propelled by increased global awareness and demand for clean energy systems, there is a growing trend in transportation, utility, industrial, and residential applications towards the utilisation of power electronic systems with enhanced power ow controllability and eciency. Examples of power electronics applications include terminal converters in high-voltage direct Current (HVDC) transmission; exible AC transmission systems (FACTS); and converters to interface alternative energy systems such as wind turbines to the grid, variable-speed motor drives in pump systems, vehicular propulsion systems, air-conditioners, and refrigerators. LÄS MER
14. Polymer-shelled Ultrasound Contrast Agents : Characterization and Application
Sammanfattning : Ultrasound-based imaging technique is probably the most used approach for rapid investigationand monitoring of anatomical and physiological conditions of internal organs and tissues.Ultrasound-based techniques do not require the use of ionizing radiation making the tests anexceptionally safe and painless. LÄS MER
15. Low-frequency noise characterization, evaluation and modeling of advanced Si- and SiGe-based CMOS transistors
Sammanfattning : A wide variety of novel complementary-metal-oxide-semiconductor (CMOS) devices that are strong contenders for future high-speed and low-noise RF circuits have been evaluated by means of static electrical measurements and low-frequency noise characterizations in this thesis. These novel field-effect transistors (FETs) include (i) compressively strained SiGe channel pMOSFETs, (ii) tensile strained Si nMOSFETs, (iii) MOSFETs with high-k gate dielectrics, (iv) metal gate and (v) silicon-on-insulator (SOI) devices. LÄS MER