Sökning: "focused ion beam scanning electron microscopy"
Visar resultat 1 - 5 av 28 avhandlingar innehållade orden focused ion beam scanning electron microscopy.
1. Fabrication and Applications of a Focused Ion Beam Based Nanocontact Platform for Electrical Characterization of Molecules and Particles
Sammanfattning : The development of new materials with novel properties plays an important role in improving our lives and welfare. Research in Nanotechnology can provide e.g. cheaper and smarter materials in applications such as energy storage and sensors. LÄS MER
2. Transmission Electron Microscopy of Graphene and Hydrated Biomaterial Nanostructures : Novel Techniques and Analysis
Sammanfattning : Transmission Electron Microscopy (TEM) on light element materials and soft matters is problematic due to electron irradiation damage and low contrast. In this doctoral thesis techniques were developed to address some of those issues and successfully characterize these materials at high resolution. LÄS MER
3. On Bone Regeneration in Porous Bioceramics - Studies in humans and rabbits using free form fabricated scaffolds
Sammanfattning : The objective of the present thesis was to evaluate the effect of material chemistry and macroand micro-porosity on bone regeneration in association with synthetic, porous ceramic materials. Ceramic scaffolds were designed and manufactured for experimental and human studies using free form fabrication (FFF), a technique which produces the object layer by layer using data from CAD files. LÄS MER
4. Bioelectronic Nanosensor Devices for Environmental and Biomedical Analysis
Sammanfattning : A new type of Bioelectronic Nanosensor Device with potential applications in medicine,biotechnology and environmental analysis was designed. The nanosensor is based on RISFET (Regional Ion Sensitive Field Effect Transistor) technology. LÄS MER
5. 3D Reconstruction of Porous and Poorly Conductive Soft Materials using FIB-SEM Tomography
Sammanfattning : Focused ion beam combined with scanning electron microscope (FIB-SEM) is a powerful tool that can be utilised to reveal the internal microstructure of materials. It basically uses ions to make cross-sections with high precision and electrons to image the cross-section surface with high spatial resolution. LÄS MER