Sökning: "focused ion beam FIB"

Visar resultat 1 - 5 av 33 avhandlingar innehållade orden focused ion beam FIB.

  1. 1. Fabrication and Applications of a Focused Ion Beam Based Nanocontact Platform for Electrical Characterization of Molecules and Particles

    Författare :Tobias Blom; Klaus Leifer; Maria Strömme; Michel Calame; Uppsala universitet; []
    Nyckelord :Focused Ion Beam; FIB; Scanning Electron Microscopy; SEM; Nanogap electrodes; Nanostructuring; Nanofabrication; Electron Beam Lithography; Electrical characterization; Dielectrophoresis;

    Sammanfattning : The development of new materials with novel properties plays an important role in improving our lives and welfare. Research in Nanotechnology can provide e.g. cheaper and smarter materials in applications such as energy storage and sensors. LÄS MER

  3. 2. Integration and Fabrication Techniques for 3D Micro- and Nanodevices

    Författare :Andreas C. Fischer; Frank Niklaus; Karl F. Böhringer; KTH; []
    Nyckelord :Microelectromechanical systems; MEMS; Nanoelectromechanical systems; NEMS; silicon; wafer-level; chip-level; through silicon via; TSV; packaging; 3D packaging; vacuum packaging; liquid encapsulation; integration; heterogeneous integration; wafer bonding; microactuators; shape memory alloy; SMA; wire bonding; magnetic assembly; self-assembly; 3D; 3D printing; focused ion beam; FIB;

    Sammanfattning : The development of micro and nano-electromechanical systems (MEMS and NEMS) with entirely new or improved functionalities is typically based on novel or improved designs, materials and fabrication methods. However, today’s micro- and nano-fabrication is restrained by manufacturing paradigms that have been established by the integrated circuit (IC) industry over the past few decades. LÄS MER

  4. 3. 3D Reconstruction of Porous and Poorly Conductive Soft Materials using FIB-SEM Tomography

    Författare :Cecilia Fager; Chalmers tekniska högskola; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; NATURVETENSKAP; NATURAL SCIENCES; NATURVETENSKAP; NATURAL SCIENCES; insulating material; 3D; interconnectivity; focused ion beam; tomography; polymer film; scanning electron microscopy;

    Sammanfattning : Focused ion beam combined with scanning electron microscope (FIB-SEM) is a powerful tool that can be utilised to reveal the internal microstructure of materials. It basically uses ions to make cross-sections with high precision and electrons to image the cross-section surface with high spatial resolution. LÄS MER

  5. 4. Quantitative 3D reconstruction of porous polymers using FIB-SEM tomography -correlating materials structures to properties of coatings for controlled drug release

    Författare :Cecilia Fager; Chalmers tekniska högskola; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; NATURVETENSKAP; NATURAL SCIENCES; tomography; controlled drug release; 3D; connectivity; insulating material; polymer film; soft material; focused ion beam; scanning electron microscopy;

    Sammanfattning : Porous networks are found in a wide range of different advanced and technologically important materials and influence the materials properties. The networks are active components in for example batteries, food and pharmaceuticals. The interconnectivity of a network strongly influences the transport properties. LÄS MER

  7. 5. On the deformation behavior and cracking of ductile iron; effect of microstructure

    Författare :Keivan Amiri Kasvayee; Anders E.W. Jarfors; Jens Bergström; Jönköping University; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Spherical graphite iron; component casting; high silicon ductile iron; digital image correlation DIC ; in-situ tensile testing; in-situ cyclic testing; DIC pattern generation; pit etching; micro-scale deformation; micro-crack; finite element analysis FEA ; focused ion beam FIB milling; segjärn; komponentgjutning; högkisellegerat segjärn; digital image correlation DIC ; insitu dragprovning; in-situ cyklisk provning; DIC-mönstergenerering; grop-etsning; mikroskalig deformation; mikrosprickor; finite element analys FEA ; fokuserad jonstråle FIB avverkning;

    Sammanfattning : This thesis focuses on the effect of microstructural variation on the mechanical properties and deformation behavior of ductile iron. To research and determine these effects, two grades of ductile iron, (i) GJS-500-7 and (ii) high silicon GJS-500-14, were cast in a geometry containing several plates with different section thicknesses in order to produce microstructural variation. LÄS MER