Sökning: "focused ion beam FIB milling"
Visar resultat 1 - 5 av 11 avhandlingar innehållade orden focused ion beam FIB milling.
1. 3D Reconstruction of Porous and Poorly Conductive Soft Materials using FIB-SEM Tomography
Sammanfattning : Focused ion beam combined with scanning electron microscope (FIB-SEM) is a powerful tool that can be utilised to reveal the internal microstructure of materials. It basically uses ions to make cross-sections with high precision and electrons to image the cross-section surface with high spatial resolution. LÄS MER
2. On the deformation behavior and cracking of ductile iron; effect of microstructure
Sammanfattning : This thesis focuses on the effect of microstructural variation on the mechanical properties and deformation behavior of ductile iron. To research and determine these effects, two grades of ductile iron, (i) GJS-500-7 and (ii) high silicon GJS-500-14, were cast in a geometry containing several plates with different section thicknesses in order to produce microstructural variation. LÄS MER
3. Mechanisms of Plastic Deformation of Cemented Carbide and Cermet Cutting Tools
Sammanfattning : In this thesis, the physical mechanisms acting during plastic deformation of hardmetals used in metal cutting applications have been investigated. Microstructural and microanalytical studies have been performed on cemented carbides as well as cermet materials. LÄS MER
4. Magnesium Diboride (MgB2) and Ca-doped YBa2Cu3O7-? : Thin Films and Devices. Fabrication and Characterization
Sammanfattning : Magnesium diboride (MgB2) is a superconductor with an exceptionally high transition temperature, Tc, of 39 K. This work describes deposition of high quality and superconducting films of MgB2 for electronic applications. Experiments on Ca-doped YBa2Cu3O7-? films and fabrication of bicrystal Josephson junctions are also described. LÄS MER
5. Characterization of Surfaces Relevant to Nanotechnology
Sammanfattning : In this thesis investigations of the structure and dynamics of semiconductor surfaces relevant for the synthesis of nanostructures are presented. The studies were performed using Scanning Tunneling Microscopy (STM), Low Energy Electron Diffraction (LEED), and Spectroscopic PhotoEmission and Low Energy Electron Microcopy (SPELEEM). LÄS MER