Sökning: "fault coverage"
Visar resultat 11 - 15 av 32 avhandlingar innehållade orden fault coverage.
11. Techniques for Automatic Generation of Tests from Programs and Specifications
Sammanfattning : Software testing is complex and time consuming. One way to reduce the effort associated with testing is to generate test data automatically. This thesis is divided into three parts. In the first part a mixed-integer constraint solver developed by Gupta et. LÄS MER
12. Active and passive seismic methods for investigating the glacially-triggered Burträsk fault
Sammanfattning : Glacially-triggered faults are of high scientific interest since their formation was likely accompanied by major earthquakes and they are still a centre of seismicity in northern Fennoscandia, today. Imaging their deeper structure mainly relies on reflection seismics since the method generally has the best resolving power at depth of all geophysical methods. LÄS MER
13. Improvements in High-Coverage and Low-Power LBIST
Sammanfattning : Testing cost is one of the major contributors to the manufacturing cost of integrated circuits. Logic Built-In Self Test (LBIST) offers test cost reduction in terms of using smaller and cheaper ATE, test data volume reduction due to on-chip test pattern generation, test time reduction due to at-speed test pattern application. LÄS MER
14. On Concurrent Error Detection and Error Propagation
Sammanfattning : This thesis addresses three important steps in the selection of error detection mechanisms for microprocessors: (i) the design and evaluation of error detection mechanisms, (ii) the study of microprocessor error behavior and propagation and (iii) the design and use of error models. The first part of the thesis evaluates four error detection methods with respect to para- meters such as error detection coverage and performance loss, while the second and third parts focus on determining the error patterns most likely to occur in a computer system when different types of faults are present and how to incorporate those error patterns into error models. LÄS MER
15. On Efficient Measurement of the Impact of Hardware Errors in Computer Systems
Sammanfattning : Technology and voltage scaling is making integrated circuits increasingly susceptible to failures caused by soft errors. The source of soft errors are temporary hardware faults that alter data and signals in digital circuits. LÄS MER