Sökning: "atom probe field ion microscopy APFIM"
Visar resultat 1 - 5 av 11 avhandlingar innehållade orden atom probe field ion microscopy APFIM.
1. Atom-Probe Field-Ion Microscopy of Electronic Materials
Sammanfattning : This thesis presents work in which atom-probe field-ion microscopy (APFIM) has been applied to two types of electronic materials. In the case of metal/GaAs contacts, the purpose was to characterise the microstructure of the contact interface, particularly the chemical composition variation across the interface. LÄS MER
2. Atom Probe Field Ion Microscopy of Surface Zones, Coatings and Interfaces
Sammanfattning : This thesis is focused on developingmethods for high resolution microanalysis of coatings on a substrate, andsurface zones of a bulk sample using atom probe field ion microscopy,APFIM. The APFIM technique is described and some examples of its applications to semiconductors,cemented carbides and intermetallic compounds are given. LÄS MER
3. Precipitate growth and coarsening in creep resistant chromium steels
Sammanfattning : .... LÄS MER
4. Microstructure of Nickel-Chromium Superalloys
Sammanfattning : The microstructure of nickel-chromium superalloys has been investigated using several advanced microanalytical techniques; atom probe field ion microscopy (APFIM), transmission electron microscopy (TEM) together with energy dispersive X-ray analysis (EDX) and electron energy loss spectroscopy (EELS), secondary ion mass spectroscopy (SIMS) and optical microscopy (OM). The features primarily considered include precipitation, segregation and ordering. LÄS MER
5. Development of Composition Gradients in Cemented Carbides
Sammanfattning : This thesis concerns the formation of tough surface zones, depleted of cubic carbo-nitrides, in cemented carbides. Several materials with varied phase compositions, binder phase volume fraction, and carbon content have been investigated. LÄS MER