Sökning: "Zhiyuan He"
Hittade 2 avhandlingar innehållade orden Zhiyuan He.
1. System-on-Chip test scheduling with defect-probability and temperature considerations
Sammanfattning : Electronic systems have become highly complex, which results in a dramatic increase of both design and production cost. Recently a core-based system-on-chip (SoC) design methodology has been employed in order to reduce these costs. LÄS MER
2. Temperature Aware and Defect-Probability Driven Test Scheduling for System-on-Chip
Sammanfattning : The high complexity of modern electronic systems has resulted in a substantial increase in the time-to-market as well as in the cost of design, production, and testing. Recently, in order to reduce the design cost, many electronic systems have employed a core-based system-on-chip (SoC) implementation technique, which integrates pre-defined and pre-verified intellectual property cores into a single silicon die. LÄS MER