Sökning: "Test Application Time TAT"

Hittade 1 avhandling innehållade orden Test Application Time TAT.

1. 1. Test Cost Reduction of 3D Stacked ICs : Test Planning and Test Flow Selection

   Författare :Breeta Sengupta; Integrerade elektroniksystem; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; NATURVETENSKAP; NATURAL SCIENCES; 3D Stacked Integrated Circuits 3D SIC ; Test Cost; Optimization; Test Flow; Design for Test DfT ; Test Application Time TAT ;

   Sammanfattning : Ever higher levels of integration within the Integrated Circuit (IC) tomeet progressively widening scope of its application in respect of functionality,size, performance and manufacturing issues inspired developmentof the three-dimensional (3D) Stacked IC as a device havingviable architecture. However, with increased complexity, manufacturingcost increased. LÄS MER