Sökning: "State-of-the-art"
Visar resultat 11 - 15 av 1232 avhandlingar innehållade ordet State-of-the-art.
11. III-V MOSFETs for High-Frequency and Digital Applications
Sammanfattning : III-V compound semiconductors are used in, among many other things, high-frequency electronics. They are also considered as a replacement for silicon in CMOS technology. Yet, a III-V transistor outperforming state-of-the-art silicon devices in VLSI-relevant metrics has not yet decisively been demonstrated. LÄS MER
12. Heterostructure Barrier Varactor Diodes for Frequency Multiplier Applications
Sammanfattning : This thesis deals with fabrication, characterisation and modelling of the Heterostructure Barrier Varactor (HBV) diode and its use in frequency multiplier circuits. Different aspects of material structures and frequency multipliers are described. LÄS MER
13. Compile-time Safety and Runtime Performance in Programming Frameworks for Distributed Systems
Sammanfattning : Distributed Systems, that is systems that must tolerate partial failures while exploiting parallelism, are a fundamental part of the software landscape today. Yet, their development and design still pose many challenges to developers when it comes to reliability and performance, and these challenges often have a negative impact on developer productivity. LÄS MER
14. Planar Heterostructure Barrier Varactor Diodes for Millimetre Wave Applications
Sammanfattning : This thesis deals with fabrication, characterisation and modelling of the Heterostructure Barrier Varactor (HBV) diode and its use in frequency multiplier applications. Different aspects of material structures and frequency multipliers are described. LÄS MER
15. Computational Methods for Computer Vision : Minimal Solvers and Convex Relaxations
Sammanfattning : Robust fitting of geometric models is a core problem in computer vision. The most common approach is to use a hypothesize-and-test framework, such as RANSAC. In these frameworks the model is estimated from as few measurements as possible, which minimizes the risk of selecting corrupted measurements. LÄS MER