Sökning: "Semiconductor device measurements"
Visar resultat 1 - 5 av 76 avhandlingar innehållade orden Semiconductor device measurements.
1. MOSFET Modeling Aimed at Minimizing EMI in Switched DC/DC Converters Using Active Gate Control
Sammanfattning : This thesis deals with electromagnetic interference that can arise from switched DC/DC-converters intended for low-power applications, e.g. within the telecom or automotiveindustry. LÄS MER
2. Photonic terahertz-wave generation, radiation and quasioptical integration
Sammanfattning : This thesis deals with the uni-travelling-carrier photodiode (UTC-PD) based photonic generation of terahertz waves, antenna designs for the terahertz radiation and a novelcatadioptric lens for quasioptical integration.The ongoing and accomplished research work on the UTC-PD, its limitations and optimisation scopes for attaining higher bandwidth and higher output power have been discussed. LÄS MER
3. EMI from Switched Converters – Simulation Methods and Reduction Techniques
Sammanfattning : In this thesis, the conducted EMI from switched power converters has been analyzed using various existing models, own-derived models as well as measurements. The ingoing passive components in a switching converter have been modeled with respect to their high frequency behavior and the static and dynamic behavior of the active semiconductors has been analyzed. LÄS MER
4. Three-Dimensional Metal-Semiconductor Heterostructures for Device Applications
Sammanfattning : Fabrication and characterisation of buried metal contacts in compound semiconductors are demonstrated. The contacts have been investigated due to their usage both as gates in transistors and as active or passive elements in novel devices. LÄS MER
5. Microwave power device characterization
Sammanfattning : The first part of the thesis covers work done on device characterizationmethods. A statistical method for estimating small-signal model parametersin FET-models was proposed. A maximum likelihood estimator wasderived and the new method was compared to a standard direct extractiontechnique. LÄS MER