Sökning: "SSRM"
Hittade 3 avhandlingar innehållade ordet SSRM.
1. Scanning capacitance microscopy for semiconductor characterisation
Sammanfattning : .... LÄS MER
2. High resolution electrical characterization of III-V materials and devices
Sammanfattning : The continuing shrinkage of semiconductor devices towards nanoscale features and increased functionality has prompted a strong need for high-resolution characterization tools capable of mapping the electrical properties with nanoscale lateral resolution. In this regard, scanning capacitance microscopy (SCM) scanning spreading resistance microscopy (SSRM) and Kelvin probe force microscopy (KPFM) have emerged as powerful techniques. LÄS MER
3. Characterization of electrical properties in 4H-SiC by imaging techniques
Sammanfattning : 4H-SiC has physical properties supremely suited for a variety of high power, high frequency and high temperature electronic device applications. To fully take advantage of the material's potential, several problems remain to be solved. LÄS MER