Sökning: "Physics of Matter"
Visar resultat 11 - 15 av 1363 avhandlingar innehållade orden Physics of Matter.
11. Linear response theory : from black hole thermalization to Weyl semimetals
Sammanfattning : Linear response theory is an incredibly powerful calculation tool. We apply this framework in quantum field theory to a variety of models originated from distinct areas in theoretical physics and for different reasons. LÄS MER
12. Growth of high quality Fe thin films : A study of the effect of mismatch strain on the physical properties of Fe
Sammanfattning : The work in this licentiate is devoted to investigating the epitaxial growth of thin Fe layers on MgAl2O4 (001) and MgO (001) substrates using dc magnetron sputtering. The aim is to qualitatively and quantitatively determine the crystal quality of the grown Fe layers depending on their thickness, substrate material, and selected deposition parameters. LÄS MER
13. New aspects of electronic interactions of keV ions with matter
Sammanfattning : Low- and medium-energy ion scattering are powerful techniques to perform high-resolution depth profiling with sub-nanometer resolution. Typically, ions with primary energies between a few keV and a few hundred keV are used to probe the sample and backscattered projectiles are detected. LÄS MER
14. Interacting Dirac Matter
Sammanfattning : The discovery of graphene in 2004 has led to a surge of activities focused on the theoretical and experimental studies of materials hosting linearly dispersive quasiparticles during the last decade. Rapid expansion in the list of materials having similar properties to graphene has led to the emergence of a new class of materials known as the Dirac materials. LÄS MER
15. Transmission Electron Microscopy for Characterization of Structures, Interfaces and Magnetic Moments in Magnetic Thin Films and Multilayers
Sammanfattning : Structural characterization is essential for the understanding of the magnetic properties of thin films and multilayers. In this thesis, both crystalline and amorphous thin films and multilayers were analyzed utilizing transmission electron microscopy (TEM). LÄS MER