Sökning: "Peter Ekberg"
Hittade 4 avhandlingar innehållade orden Peter Ekberg.
1. Ultra precision metrology : the key for mask lithography and manufacturing of high definition displays
Sammanfattning : Metrology is the science of measurement. It is also a prerequisite for maintaining a high quality in all manufacturing processes. In this thesis we will present the demands and solutions for ultra-precision metrology in the manufacturing of lithography masks for the TV-display industry. LÄS MER
2. Development of ultra-precision tools for metrology and lithography of large area photomasks and high definition displays
Sammanfattning : Large area flat displays are nowadays considered being a commodity. After the era of bulky CRT TV technology, LCD and OLED have taken over as the most prevalent technologies for high quality image display devices. LÄS MER
3. Enhanced image analysis, a tool for precision metrology in the micro and macro world
Sammanfattning : The need for high speed and cost efficient inspection in manufacturing lineshas led to a vast usage of camera-based vision systems. The performance ofthese systems is sufficient to determine shape and size, but hardly to an accuracylevel comparable with traditional metrology tools. LÄS MER
4. Improved inspection and micrometrology of embedded structures in multi-layered ceramics : Development of optical coherence tomographic methods and tools
Sammanfattning : Roll-to-roll manufacturing of micro components based on advanced printing, structuring and lamination of ceramic tapes is rapidly progressing. This large-scale and cost-effective manufacturing process of ceramic micro devices is however prone to hide defects within the visually opaque tape stacks. LÄS MER