Sökning: "PEEM"
Visar resultat 1 - 5 av 6 avhandlingar innehållade ordet PEEM.
1. Time-Resolved Photoemission Electron Microscopy: Development and Applications
Sammanfattning : Time-resolved photoemission electron microscopy (TR-PEEM) belongs to a class of experimental techniquescombining the spatial resolution of electron-based microscopy with the time resolution of ultrafast opticalspectroscopy. This combination provides insight into fundamental processes on the nanometer spatial andfemto/picosecond time scale, such as charge carrier transport in semiconductors or collective excitations ofconduction band electrons at metal surfaces. LÄS MER
2. Photoemission Electron Microscopy for Ultrafast Nano-Optics - Femtoseconds to Attoseconds
Sammanfattning : Ultrafast nano-optics is a new and quickly evolving research field centred around the control, manipulation, and application of light on a nanometre and femtosecond scale. This can lead to improved electro-optical devices, more sensitive spectroscopy, and real-time control of chemical reactions. LÄS MER
3. X-ray Absorption Spectroscopy on Nano-Magnet Arrays and Thin Films : Magnetism and Structure
Sammanfattning : The magnetic and structural properties of nano magnet arrays and ferromagnetic thin films are investigated. Circular x-rays are used and extensive use is made in this Thesis of the X-ray Magnetic Circular Dichroism (XMCD) technique. By means of the XMCD magneto-optic sum rules the values of the orbital and spin moments are determined. LÄS MER
4. Towards ultrafast imaging with extreme ultraviolet light sources
Sammanfattning : This thesis reports experimental studies performed with two advanced coherent XUV sources with ultrashort pulse duration, high-order harmonic generation and seeded-free electron laser. High-order harmonic generation (HHG) is the generation of overtones of a fundamental laser pulse in a medium, e.g. noble gases. LÄS MER
5. III–V Nanowire Surfaces
Sammanfattning : This dissertation deals with the geometric and electronic structure of surfaces on III–V semiconductor nanowires (NWs). NWs made of InAs, GaAs, and InP have been studied using scanning tunneling microscopy/spectroscopy (STM/S), low energy electron microscopy (LEEM), photoemission electron microscopy (PEEM), and x-ray photoelectron spectroscopy (XPS). LÄS MER