Sökning: "Metrology"

Visar resultat 1 - 5 av 75 avhandlingar innehållade ordet Metrology.

1. 1. Ultra precision metrology : the key for mask lithography and manufacturing of high definition displays

   Författare :Peter Ekberg; Lars Mattsson; Torgny Carlsson; KTH; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Ultra precision metrology; LCD-display; OLED-display; nm-resolution; large area; random phase measurement; acousto-optic deflection; scanning; 2D measurement; mask; CCD; CMOS; image processing; edge detection; TECHNOLOGY; TEKNIKVETENSKAP; Manufacturing engineering; Produktionsteknik;

   Sammanfattning : Metrology is the science of measurement. It is also a prerequisite for maintaining a high quality in all manufacturing processes. In this thesis we will present the demands and solutions for ultra-precision metrology in the manufacturing of lithography masks for the TV-display industry. LÄS MER

3. 2. Exploiting the Terahertz Spectrum with Silicon Micromachining : Waveguide Components, Systems and Metrology

   Författare :James Campion; Joachim Oberhammer; Umer Shah; Robert M. Weikle II; KTH; []
   Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Terahertz; Silicon Micromachining; Waveguide; Waveguide System; Metrology; Electrical Engineering; Elektro- och systemteknik;

   Sammanfattning : The terahertz spectrum (300 GHz - 3 THz) represents the final frontier for modern electronic and optical systems, wherein few low-cost, volume-manufacturable solutions exist. THz frequencies are of great scientific and commercial interest, with applications as diverse as radio astronomy, sensing and imaging and wireless communications. LÄS MER

4. 3. Assessment of optical coherence tomography for metrology applications in high-scattering ceramic materials

   Författare :Rong Su; Lars Mattsson; Hjalmer Granberg; KTH; []
   Nyckelord :metrology; optical coherence tomography; alumina ceramics; nondestructive testing; imaging through turbid media; light scattering; image processing; numerical approximation and analysis; Monte Carlo method;

   Sammanfattning : Large-scale and cost-effective manufacturing of ceramic micro devices based on tape stacking requires the development of inspection systems to perform high-resolution in-process quality control of embedded manufactured cavities, metal structures and defects.In this work, alumina ceramic samples are evaluated by optical coherence tomography (OCT) operating at 1. LÄS MER

5. 4. Enhanced image analysis, a tool for precision metrology in the micro and macro world

   Författare :Bita Daemi; Lars Mattsson; Peter Ekberg; Mikael Sjödahl; KTH; []
   Nyckelord :Image processing; image metrology; precision metrology; image correlation; subpixel; accuracy; uncertainty; Production Engineering; Industriell produktion;

   Sammanfattning : The need for high speed and cost efficient inspection in manufacturing lineshas led to a vast usage of camera-based vision systems. The performance ofthese systems is sufficient to determine shape and size, but hardly to an accuracylevel comparable with traditional metrology tools. LÄS MER

7. 5. Epitaxial Graphene Technology for Quantum Metrology

   Författare :Thomas Yager; Chalmers tekniska högskola; []
   Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; charge neutrality; optical microscopy; Epitaxial graphene; resistance metrology; silicon carbide; quantum Hall effect; electron transport; bilayer graphene;

   Sammanfattning : Graphene grown on silicon carbide by high-temperature annealing (SiC/G) is a strong contender in the race towards large-scale graphene electronics applications. The unique electronic properties of this system lead to a remarkably robust and accurate Hall resistance quantisation of 0. LÄS MER