Sökning: "Kenneth Järrendahl"
Hittade 5 avhandlingar innehållade orden Kenneth Järrendahl.
1. Optical studies of AlN and GaO based nanostructures using Mueller matrix spectroscopic ellipsometry
Sammanfattning : This thesis explores the diverse optical properties manifested when light interacts with various materials, with an emphasis on circular polarization- and bandgaprelated phenomena. The studies in this work are centered around Mueller matrix spectroscopic ellipsometry, with the objective of synthesizing and characterizing nanostructured and high-quality thin films to expand our understanding of the optical properties arising from their underlying structure and electronic transitions, respectively. LÄS MER
2. Optical and Structural Characterization of Natural Nanostructures
Sammanfattning : The spectacular biodiversity of our planet is the result of millions of years of evolution. Over this time animals and plants have evolved and adapted to different environments, developing specific behavioral and physical adaptations to increase their chances of survival. LÄS MER
3. Mueller matrix ellipsometry studies of nanostructured materials
Sammanfattning : Materials can be tailored on the nano-scale to show properties that cannot be found in bulk materials. Often these properties reveal themselves when electromagnetic radiation, e.g. light, interacts with the material. LÄS MER
4. Optical Studies of Bio-inspired Materials for Camouflage
Sammanfattning : In the ongoing sensor-camouflage duel, new functionalities and sensing abilities are continuously incorporated in detector devices, requiring new capabilities on the camouflage side. The aim of this work is to contribute to improved camouflage including low polarization detectability in wavelength regions with both visible and invisible light. LÄS MER
5. Optical Studies of Materials for Spectral Design
Sammanfattning : Optical material properties have been studied in a wide wavelength range. Theaim is future use of spectral design for camou age. The main characterization techniques used in this work are Refection Spectroscopy, Scatterometry (BRDF) and Mueller Matrix Ellipsometry. LÄS MER
