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1. Fabrication, Characterization and Applications of Porous Silicon Thin Films and Multilayered Systems
Sammanfattning : Variable angle spectroscopic ellipsometry was used for characterization of single- as well as multilayered systems of porous silicon. In addition to the complex structures such as Bragg reflectors and Fabry-Pérot filters, more advanced continuos porosity profiles were manufactured in a controlled manner. LÄS MER
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