Sökning: "FORCE MICROSCOPY"
Visar resultat 1 - 5 av 346 avhandlingar innehållade orden FORCE MICROSCOPY.
1. Surface interactions and adsorbate structures : An atomic force microscopy study
Sammanfattning : Atomic force microscopy, AFM, was used for studying somecurrent topics in the field of surface and colloid science. Themain topics addressed in this thesis were: the nature of thelong-range attraction between hydrophobic surfaces; slidingfriction behavior for microscopic contacts; and interfacialstructuring of polyelectrolyte-nanoparticle multilayerfilms. LÄS MER
2. Imaging materials with intermodulation : Studies in multifrequency atomic force microscopy
Sammanfattning : The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. LÄS MER
3. Force measurements using scanning probe microscopy : Applications to advanced powder processing
Sammanfattning : The object of this thesis is to apply scanning probemicroscopy (SPM) to the field of advanced powder processing.Measurement of interparticle surface forces at conditionsrelevant to ceramic processing has been performed together withthorough studies of powder friction. LÄS MER
4. Investigating nano-scale viscous and elastic forces withintermodulation : Studies in multifrequency atomic force microscopy
Sammanfattning : Investigating visco-elastic forces at the nanometer-scale is important to thecharacterization of soft materials. A quantitative force measurement can be ob-tained using an atomic force microscope (AFM) with a calibrated force transducer(the AFM cantilever). LÄS MER
5. Reconstructing force from harmonic motion
Sammanfattning : High-quality factor oscillators are often used in measurements of verysmall force since they exhibit an enhanced sensitivity in the narrow frequencyband around resonance. Forces containing frequencies outside this frequencyband are often not detectable and the total force acting on the oscillatorremains unknown. LÄS MER