Sökning: "Design for Test DfT"

Hittade 5 avhandlingar innehållade orden Design for Test DfT.

  1. 1. An Integrated System-Level Design for Testability Methodology

    Författare :Erik Larsson; Zebo Peng; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Digital systems; Test design; System-on-chip; Hardware; Systems design; Testing; Dissertations; Hårdvara; Systemutveckling; Testning; Databehandling Systemutveckling; Computer and systems science; Data- och systemvetenskap;

    Sammanfattning : HARDWARE TESTING is commonly used to check whether faults exist in a digital system. Much research has been devoted to the development of advanced hardware testing techniques and methods to support design for testability (DFT). LÄS MER

  3. 2. Test Cost Reduction of 3D Stacked ICs : Test Planning and Test Flow Selection

    Författare :Breeta Sengupta; Integrerade elektroniksystem; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; NATURVETENSKAP; NATURAL SCIENCES; 3D Stacked Integrated Circuits 3D SIC ; Test Cost; Optimization; Test Flow; Design for Test DfT ; Test Application Time TAT ;

    Sammanfattning : Ever higher levels of integration within the Integrated Circuit (IC) tomeet progressively widening scope of its application in respect of functionality,size, performance and manufacturing issues inspired developmentof the three-dimensional (3D) Stacked IC as a device havingviable architecture. However, with increased complexity, manufacturingcost increased. LÄS MER

  4. 3. Contactless Test of Circuit Boards

    Författare :Abdelghani Renbi; Heli Jantunen; Luleå tekniska universitet; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Industriell elektronik; Industrial Electronics;

    Sammanfattning : Electronics are still continuing to respond to the small-feature size requirement for economical, performance and environmental benefits.Due to the non-idealities in the manufacturing process of circuit boards, electronics production yield is never 100 %. LÄS MER

  5. 4. Flexible Wireless Receivers: On-Chip Testing Techniques and Design for Testability

    Författare :Rashad Ramzan; Jerzy Dabrowski; Atila Alvandpour; Kari Halonen; Linköpings universitet; []
    Nyckelord :TECHNOLOGY; TEKNIKVETENSKAP;

    Sammanfattning : In recent years the interest in the design of low cost multistandard mobile devices has gone from technical aspiration to the commercial reality. Usually, the emerging wireless applications prompt the conception of new wireless standards. The end user wants to access voice, data, and streaming media using a single wireless terminal. LÄS MER

  7. 5. Improvements in High-Coverage and Low-Power LBIST

    Författare :Nan Li; Elena Dubrova; Krishnendu Chakrabarty; KTH; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

    Sammanfattning : Testing cost is one of the major contributors to the manufacturing cost of integrated circuits. Logic Built-In Self Test (LBIST) offers test cost reduction in terms of using smaller and cheaper ATE, test data volume reduction due to on-chip test pattern generation, test time reduction due to at-speed test pattern application. LÄS MER