Sökning: "Deep level transient spectroscopy"

Visar resultat 1 - 5 av 17 avhandlingar innehållade orden Deep level transient spectroscopy.

  1. 1. Capacitance Spectroscopy of Point Defects in Silicon and Silicon Carbide

    Detta är en avhandling från Kista : Mikroelektronik och informationsteknik

    Författare :Denny Åberg; KTH.; [2001]
    Nyckelord :capacitance spectrocopy; deep levels; deep level transient spectroscopy; thermal donors; thermal double donors; ultra shallow thermal donors; chemical kinetics; silicon carbide; ion implantation; implantation induced defects; implantation induced pas;

    Sammanfattning : .... LÄS MER

  2. 2. Growth and characterization of SiC and GaN

    Detta är en avhandling från Linköping : Linköping University Electronic Press

    Författare :Rafal Ciechonski; Linköpings universitet.; Linköpings universitet.; [2007]
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; SiC; GaN; Deep level transient spectroscopy; Minority Carrier Transient Spectroscopy; Hall effect; Cathodoluminescence; Scanning electron microscopy; Atomic Force microscopy; sublimation growth; MOCVD; heterostructures; High Electron Mobility transistor; point defects; TECHNOLOGY Engineering physics Material physics with surface physics; TEKNIKVETENSKAP Teknisk fysik Materialfysik med ytfysik;

    Sammanfattning : At present, focus of the SiC crystal growth development is on improving the crystalline quality without polytype inclusions, micropipes and the occurrence of extended defects. The purity of the grown material, as well as intentional doping must be well controlled and the processes understood. LÄS MER

  3. 3. Optical Studies of InAs Quantum Dots in III-V Semiconductors

    Detta är en avhandling från Solid State Physics, Lund University

    Författare :Lars Landin; Lunds universitet.; Lund University.; [2000]
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; quantum dots; III-V semiconductors; k.p calculations; photoluminescence; deep-level transient spectroscopy; photoconductivity; few particle effect; single dot spectroscopy; InAs InP; Semiconductory physics; Halvledarfysik; Fysicumarkivet A:2000:Landin; InAs GaAs;

    Sammanfattning : I this thesis, optical studies of InAs quantum dots (QDs) in GaAs and InP are presented. The electronic structure of these zero dimensional structures, grown in the Stranski-Krastanow growth mode, was studied by photoluminescence spectroscopy (PL), junction space-charge techniques (JSCT) and photoconductivity (PC) measurements. LÄS MER

  4. 4. Deep levels in SiC

    Detta är en avhandling från Linköping : Linköping University Electronic Press

    Författare :Franziska C. Beyer; Linköpings universitet.; Linköpings universitet.; [2011]
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; NATURAL SCIENCES; NATURVETENSKAP;

    Sammanfattning : Silicon carbide (SiC) has been discussed as a promising material for high power bipolar devices for almost twenty years. Advances in SiC crystal growth especially the development of chemical vapor deposition (CVD) have enabled the fabrication of high quality material. LÄS MER

  5. 5. Carrier Lifetime Relevant Deep Levels in SiC

    Detta är en avhandling från Linköping : Linköping University Electronic Press

    Författare :Ian Don Booker; Linköpings universitet.; Linköpings universitet.; [2015]
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Silicon carbide; Deep level transient spectroscopy; Deep level; Carrier lifetime; Time-resolved photoluminescence;

    Sammanfattning : Silicon carbide (SiC) is currently under development for high power bipolar devices such as insulated gate bipolar transistors (IGBTs). A major issue for these devices is the charge carrier lifetime, which, in the absence of structural defects such as dislocations, is influenced by point defects and their associated deep levels. LÄS MER