Sökning: "David L. J. Engberg"
Hittade 1 avhandling innehållade orden David L. J. Engberg.
1. Atom Probe Tomography of Hard Nitride and Boride Thin Films
Sammanfattning : Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. LÄS MER
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