Sökning: "David Hultman"

Visar resultat 1 - 5 av 6 avhandlingar innehållade orden David Hultman.

  1. 1. Atom Probe Tomography of TiSiN Thin Films

    Författare :David Engberg; Lars Hultman; Magnus Odén; Fang Liu; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

    Sammanfattning : This thesis concerns the wear resistant coating TiSiN and the development of the analysis technique atom probe tomography (APT) applied to this materials system. The technique delivers compositional information through time-of-flight mass spectrometry, with sub-nanometer precision in 3D for a small volume of the sample. LÄS MER

  3. 2. Dissertatio medica de asthmate, quam, consent. exper. facult. medica in regia academia Upsaliensi, præside, Samuele Aurivillio, ... pro gradu doctoris obtinendo, publico submittit examini David Hultman, Upsaliensis. In audit. Carol. maj. d. XXX. April. anni MDCCLXIII

    Författare :Samuel Aurivillius; David Hultman; Samuel Aurivillius; Uppsala universitet; []
    Nyckelord :;

    Sammanfattning : .... LÄS MER

  4. 3. Instructio musei rerum naturalium, quam, consensu experient. et nobiliss. Facult. Medic. Upsal., sub præsidio ... Caroli Linnæi ... placidæ bonorum censuræ subjicit ... David Hultman, Uplandus. In aud. Car. maj. d. XIV. Nov, an. MDCCLIII. H. A. M. S

    Författare :Carl von Linné; David Hultman; Carl von Linné; Uppsala universitet; []
    Nyckelord :Natural history; Museum techniques; Museum techniques; Natural history; Naturaliesamlingar; Museiteknik;

    Sammanfattning : .... LÄS MER

  5. 4. Nanocrystalline Alumina-Zirconia Thin Films Grown by Magnetron Sputtering

    Författare :David Huy Trinh; Hans Högberg; Marianne Collin; Lars Hultman; Ingrid Reineck; Mats Halvarsson; Linköpings universitet; []
    Nyckelord :NATURAL SCIENCES; NATURVETENSKAP;

    Sammanfattning : Alumina-zirconia thin films have been deposited using dual magnetron sputtering. Film growth was performed at relatively low-to-medium temperatures, ranging from ~300°C to 810 °C. Different substrates were applied, including silicon (100), and industrially relevant materials, such as WC-Co hardmetal. LÄS MER

  7. 5. Atom Probe Tomography of Hard Nitride and Boride Thin Films

    Författare :David L. J. Engberg; Lars Hultman; Magnus Odén; Guido Schmitz; Linköpings universitet; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Materials science; Atom probe tomography APT ; Ceramics; Nitrides; Borides;

    Sammanfattning : Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. LÄS MER